J.M.Pearce (talk | contribs) m (Created page with "{{MOST}} category:MOST methods This page will detail the methods used to characterize gallium nitride (GaN) to be used as a substrate material for the electronics industry. ...") |
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==What tools are used?== | ==What tools are used?== | ||
===Installed apparatus in the MBE facility MTU=== | |||
====RHEED Gun==== | |||
Perkin Elmer Model 06-190 10 keV HEED Gun, Perkin Elmer 20-330 RHEED Gun Control | |||
====CCD Camera/Crystal Monitor==== | |||
K-Space (KSA) BP-M1 CCD Camera, KSA 300/400 Software | |||
====Gas Analyzer/Mass Spectrometer==== | |||
Inficon Transpector TH100 F&M Quadrupole Residual Gas Analyzer, Transpector Ware V2.0 Software | |||
===Available External Facilities in MTU=== | |||
1)Field Emission Scanning Electron Microscopy | |||
2)Transmission Electron Microscopy | |||
3)Atomic Force Microscopy | |||
4)Pumping Laser Photoluminescence System | |||
==How accurate do the tools need to be?== | ==How accurate do the tools need to be?== | ||
==What is the best state-of-the-art GaN material?== | ==What is the best state-of-the-art GaN material?== | ||
Revision as of 20:27, 9 October 2013
This page will detail the methods used to characterize gallium nitride (GaN) to be used as a substrate material for the electronics industry.
It will answer the following questions
What tools are used?
Installed apparatus in the MBE facility MTU
RHEED Gun
Perkin Elmer Model 06-190 10 keV HEED Gun, Perkin Elmer 20-330 RHEED Gun Control
CCD Camera/Crystal Monitor
K-Space (KSA) BP-M1 CCD Camera, KSA 300/400 Software
Gas Analyzer/Mass Spectrometer
Inficon Transpector TH100 F&M Quadrupole Residual Gas Analyzer, Transpector Ware V2.0 Software
Available External Facilities in MTU
1)Field Emission Scanning Electron Microscopy 2)Transmission Electron Microscopy 3)Atomic Force Microscopy 4)Pumping Laser Photoluminescence System