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==What tools are used?== | ==What tools are used?== | ||
===Installed apparatus in the MBE facility | ===Installed apparatus in the MBE facility MOST=== | ||
====RHEED Gun==== | ====RHEED Gun==== | ||
Perkin Elmer Model 06-190 10 keV HEED Gun, Perkin Elmer 20-330 RHEED Gun Control | Perkin Elmer Model 06-190 10 keV HEED Gun, Perkin Elmer 20-330 RHEED Gun Control |
Revision as of 20:33, 9 October 2013
This page will detail the methods used to characterize gallium nitride (GaN) to be used as a substrate material for the electronics industry.
It will answer the following questions
What tools are used?
Installed apparatus in the MBE facility MOST
RHEED Gun
Perkin Elmer Model 06-190 10 keV HEED Gun, Perkin Elmer 20-330 RHEED Gun Control
CCD Camera/Crystal Monitor
K-Space (KSA) BP-M1 CCD Camera, KSA 300/400 Software
Gas Analyzer/Mass Spectrometer
Inficon Transpector TH100 F&M Quadrupole Residual Gas Analyzer, Transpector Ware V2.0 Software
Available Facilities in MTU
1)Field Emission Scanning Electron Microscopy 2)Transmission Electron Microscopy 3)Atomic Force Microscopy 4)X-Ray Diffraction Facility 5)Pumping Laser Photoluminescence System