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Inficon Transpector TH100 F&M Quadrupole Residual Gas Analyzer, Transpector Ware V2.0 Software | Inficon Transpector TH100 F&M Quadrupole Residual Gas Analyzer, Transpector Ware V2.0 Software | ||
===Available | ===Available Facilities in MTU=== | ||
1)Field Emission Scanning Electron Microscopy | 1)Field Emission Scanning Electron Microscopy | ||
2)Transmission Electron Microscopy | 2)Transmission Electron Microscopy | ||
3)Atomic Force Microscopy | 3)Atomic Force Microscopy | ||
4)Pumping Laser Photoluminescence System | 4)X-Ray Diffraction Facility | ||
5)Pumping Laser Photoluminescence System | |||
==How accurate do the tools need to be?== | ==How accurate do the tools need to be?== | ||
==What is the best state-of-the-art GaN material?== | ==What is the best state-of-the-art GaN material?== |
Revision as of 20:32, 9 October 2013
This page will detail the methods used to characterize gallium nitride (GaN) to be used as a substrate material for the electronics industry.
It will answer the following questions
What tools are used?
Installed apparatus in the MBE facility MTU
RHEED Gun
Perkin Elmer Model 06-190 10 keV HEED Gun, Perkin Elmer 20-330 RHEED Gun Control
CCD Camera/Crystal Monitor
K-Space (KSA) BP-M1 CCD Camera, KSA 300/400 Software
Gas Analyzer/Mass Spectrometer
Inficon Transpector TH100 F&M Quadrupole Residual Gas Analyzer, Transpector Ware V2.0 Software
Available Facilities in MTU
1)Field Emission Scanning Electron Microscopy 2)Transmission Electron Microscopy 3)Atomic Force Microscopy 4)X-Ray Diffraction Facility 5)Pumping Laser Photoluminescence System