Filmetrics F20-EXR thin-film analyzer can be used to measure thickness of thin films or transmission of light through substrates. Transmission is measured only at 180 degrees. The wavelength range is 390-1700nm at intervals of 1nm. It is capable of measuring thicknesses between 15nm and 250um. This page only describes the % transmission measurements and not thickness calculations.

This system is located in M&M 532 (Michigan Technological University). Access may be granted after training by Dr. Peter Moran (pdmoran@mtu.edu). Alternatively, please contact Dr. Chito Kendrick (cekendri@mtu.edu) for more details regarding access/training.

You need

  1. a 1/16" hex key
  2. fiber optic cable
  3. spacer (10-15cm tall)
  4. your sample

Procedure

The spectrometer input is connected to the bottom on the sample holder using a second fiber optic cable. To do this and to eliminate bends in the cable, use a 2 metre long cable and elevate the instrument at least 10-15cm. To fasten this fiber optic cable, you will need a 1/16" hex key.

Detailed instructions to do this (along with a schematic) are available in the "Help" section of the software.

Data analysis

NOTE: The computer that is used for this system has a faulty display adapter (as on July 15, 2019). Screenshots will not work. Always save your raw data as .csv and use a different software of your choice to plot it.

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Created July 15, 2019 by Nupur Bihari
Last edit November 28, 2025 by StandardWikitext bot