Major Equipment

• PV Measurements Inc. Class AAA Solar Simulator for light I-V, photoconductivity, dark IV
• PV Measurements Inc. Spectral Response system for quantum efficiency (internal and external)

and designed specifically for PV materials characterization:

• J.A. Woollam extended range VASE spectroscopic ellipsometer
• Spectra Nova custom designed dual beam photoconductivity apparatus

Minor Equipment

• RapMan

ThermoFisher RTE-740 Thermal Bath

PV Measurements Inc. Class AAA Solar Simulator for light I-V, photoconductivity, dark IV

From Chemistry - http://www.chem.queensu.ca/Facilities/ipem.asp

• Scanning Auger Microscope (SAM)
• X-Ray Photoelectron Spectroscopy (XPS)
• X-Ray Crystallography (between 90 and 300K)
• Scanning Electron Micropscope (SEM)
• Depth Profile Analysis
• Mass Spectrometry
• NMR
• Atomic Force Microscope
• Nano-indentor

From Physics

• x-ray diffractometer (XRD) (robbie)
• variable angle spectroscopic ellipsometer (robbie)
• LEO 1530 field emission scanning electron microscope (SEM) (robbie)
• atomic force microscope (AFM) (robbie)
• custom-design glancing angle deposition system (robbie)
• Scanning Tunneling microscopy
• He-Cd UV/Blue Laser (jungao)
• Keithley Source Measurement Units (two 237, one 238) (jungao)
• Keithley Multimeters and Nanovoltmeter (jungao)
• Ultra Precision Capacitance Bridge (jungao)
• Minolta Luminance Meter (jungao)
• Lock-in Amplifier (jungao)
• Oceanoptics HR 2000 Spectrophotometer (jungao)
• Hamamatsu Amplified Photodiodes (jungao)
• UV/Ozone Substrate Cleaner and Ultrosonication Cleaners (jungao)
• Oven and Analytical Balance (jungao)
• Digital Stirring Hotplate and Spin Coater (jungao)
• AM 1.5 Solar Simulator (jungao)
• Turbo Pumping Stations (jungao)
• nlinear optical microscope (Nunzi),
• femtosecond infrared Er-fibre laser (Nunzi)
• contineous visible solid state YAG-laser (Nunzi)
• semiconductor parameters' analyser (Nunzi)
• Laser (500-2200nm)(fraser)