{"id":73891,"key":"Micromorphology_analysis_of_sputtered_indium_tin_oxide_fabricated_with_variable_ambient_combinations","title":"Micromorphology analysis of sputtered indium tin oxide fabricated with variable ambient combinations","latest":{"id":1224961,"timestamp":"2026-01-09T01:58:31Z"},"content_model":"wikitext","license":{"url":"https://www.appropedia.org/Appropedia:Copyrights","title":"CC-BY-SA-4.0"},"source":"{{MOST}}\n\n[[File:Afmmicromorphanalysis.jpg|thumb]]\n\n{{Publication data\n| type = Paper\n| cite-as = Ştefan Ţălu, Slawomir Kulesza, Miroslaw Bramowicz, Adam M. Pringle, Joshua M. Pearce, M. Marikkannan, V. Vishnukanthang, J. Mayandi. [https://doi.org/10.1016/j.matlet.2018.03.005 Micromorphology analysis of sputtered indium tin oxide fabricated with variable ambient combinations]. ''Materials Express''. 220 (2018), 169–171. doi:10.1016/j.matlet.2018.03.005 [https://www.academia.edu/36214749/Micromorphology_analysis_of_sputtered_indium_tin_oxide_fabricated_with_variable_ambient_combinations open access preprint]\n}}\n\nThis study experimentally investigates the fractal nature of the DC magnetron sputtered indium-tin oxide (ITO) fabricated utilizing mixed ambient combinations and post-annealed at 450 °C in air towards solar cell applications. The structural properties of the films were examined by X-ray diffraction technique. In addition, three-dimensional (3-D) surface morphology of the films was analyzed using the areal autocorrelation function and pseudo-topothesy K for the atomic force microscopy images. The fractal nature of films was co-related with respect to electrical and optical properties of ITO films prepared under five different ambient conditions.\n\n{{Pearce publications notice}}\n\n== Highlights ==\n\n* Indium-tin oxide (ITO) thin films fabricated by DC magnetron sputtering method.\n* ITO films prepared under different mixed sputtering ambient.\n* Three-dimensional (3-D) micromorphology analysis of sputtered ITO thin films.\n* Fractal geometry analyzed by areal autocorrelation function and pseudo-topothesy K.\n* Influence of sputtering ambient on 3-D micromorphology correlated.\n\n== Keywords ==\n\n Indium-tin oxide thin film; different sputtering ambient; atomic force microscopy; fractal analysis; and surface topography\n\n== See also ==\n\n* [[Effect of ambient combinations of argon, oxygen, and hydrogen on the properties of DC magnetron sputtered indium tin oxide films]]\n* [[Advances in plasmonic light trapping in thin-film solar photovoltaic devices]]\n* [[Plasmonic Perfect Meta-Absobers for a-Si PV Devices]]\n* [[Limitations of ultra-thin transparent conducting oxides for integration into plasmonic-enhanced thin-film solar photovoltaic devices]]\n* [[Influence of Oxygen Concentration on the Performance of Ultra-Thin RF Magnetron Sputter Deposited Indium Tin Oxide Films as a Top Electrode for Photovoltaic Devices]]\n* [[Optical modelling of thin film microstructures literature review]]\n* [[Multi-resonant silver nano-disk patterned thin film hydrogenated amorphous silicon solar cells for Staebler-Wronski effect compensation]]\n* [[A new method of preparing highly conductive ultra-thin indium tin oxide for plasmonic-enhanced thin film solar photovoltaic devices]]\n* [[Ambiance-dependent Agglomeration and Surface-enhanced Raman Spectroscopy Response of Self-assembled Silver Nano-particles for Plasmonic Photovoltaic Devices]]\n* [[Properties of Al-Doped Zinc Oxide and In-Doped Zinc Oxide Bilayer Transparent Conducting Oxides for Solar Cell Applications]]\n\n{{Page data\n| license = CC-BY-SA-3.0\n| title-tag = Micromorphology Analysis of Sputtered ITO with Variable Ambient\n| description = Explore ITO film structure for solar applications. Appropedia summarizes material research findings.\n}}\n\n[[Category:MOST completed projects and publications]]\n[[Category:Materials processing]]\n[[Category:materials science]]\n[[Category:science]]"}