| This is in a series of literature reviews on InGaN solar cells, which supported the comprehensive review by D.V.P. McLaughlin & J.M. Pearce, "Progress in Indium Gallium Nitride Materials for Solar Photovoltaic Energy Conversion"Metallurgical and Materials Transactions A 44(4) pp. 1947-1954 (2013). open access Others: InGaN solar cells| InGaN PV| InGaN materials| InGan LEDs| Nanocolumns and nanowires| Optical modeling of thin film microstructure| Misc. |
This page describes selected literature available on InGaN based LED and LASER devices.
The Controlled Growth of GaN Nanowires[1]
Abstract: This paper reports a scalable process for the growth of high-quality GaN nanowires and uniform nanowire arrays in which the position and diameter of each nanowire is precisely controlled. The approach is based on conventional metalorganic chemical vapor deposition using regular precursors and requires no additional metal catalyst. The location, orientation, and diameter of each GaN nanowire are controlled using a thin, selective growth mask that is patterned by interferometric lithography. It was found that use of a pulsed MOCVD process allowed the nanowire diameter to remain constant after the nanowires had emerged from the selective growth mask. Vertical GaN nanowire growth rates in excess of 2 μm/h were measured, while remarkably the diameter of each nanowire remained constant over the entire (micrometer) length of the nanowires. The paper reports transmission electron microscopy and photoluminescence data.
- Reports a scalable process for the growth of high-quality GaN nanowires and uniform nanowire arrays in which the position and diameter of each nanowire is precisely controlled based on conventional metal-organic chemical vapor deposition (MOCVD) using trimethygallium (TMGa) and ammonia (NH3) and requires no additional metal catalyst.
- The location, orientation, and diameter of each GaN nanowire are controlled using a thin, selective-growth mask that is patterned by interferometric lithography.
- This method enables to fabricate high quality symmetrical hexagonal sidewall facets over the entire micrometer length of nanowires.
- This method was carried out in two phases, first phase used continous MOCVD till nanowires emerged out of mask and second phase was pulse MOCVD to fabricate nanowires emerged out of mask at the end of phase one, using pulsed MOCVD in second phase maintained the quality of nanowires and were highly alligned and ordered as desired with respect to the mask.
- diameter of the nanowire remains constant as it emerges from the growth mask, confirming from XTEM images that the nanowire diameter is indeed controlled by the diameter of the growth mask aperture.
- XTEM images show no threading dislocations (TDs) in the GaN nanowires, even though TDs were observed in the planar GaN film beneath the growth mask. This was found to be the case for GaN nanowire growth on all substrates, including growth on silicon (111).
- recorded band-edge PL peak intensity for the nanowire sample was 100 times greater than that measured for a 5 micron planar GaN film and more than 200 times greater than that measured for a 0.6 micron planar GaN film. Much of this intensity increase is undoubtedly due to the geometry of a nonplanar nanowire sample, where the input coupling of the PL pump beam and the out-coupling of the resulting PL will both be increased significantly.
References
- ↑ Hersee, S.D., Sun, X. & Wang, X., 2006. The Controlled Growth of GaN Nanowires. Nano Lett., 6(8), pp.1808-1811