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A typical AFM image of a calibration sample with an etched grid of period 1um. Note that an AFM records the topography of the sample and the resulting 3D image can be manipulated to view the sample from any angle after the scan is complete.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 14:57, 21 August 2009 | | 1,024 × 768 (69 KB) | S.Keating (talk | contribs) | A typical AFM image of a calibration sample with an etched grid of period 1um. Note that an AFM records the topography of the sample and the resulting 3D image can be manipulated to view the sample from any angle after the scan is complete. |
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