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While there are many techniques to perform a quantitative analysis, here we will focus on two of the more common tools for material analysis: [http://en.wikipedia.org/wiki/X-ray_Diffraction X-Ray Diffraction] (XRD) and [http://en.wikipedia.org/wiki/Ultraviolet%E2%80%93visible_spectroscopy Ultraviolet-visible spectroscopy] (UV-Vis) analyses.
X-Ray Diffraction Analysis-XRD is a common tool used to analyze and characterize different materials and their properties. The procedure sees a small powder or thin film sample loaded into an X-Ray diffractometer and then exposed to X-Rays. The angle at which the incident rays meet the sample and the angle at which the diffracted rays are caught by the detector are changed periodically during the test. This is because different materials will have different positions where the energy diffracted toward the detector is at its highest, these will form the peaks we see on diffractograms. [Need to insert short discussion on what can be learned from diffractograms These peaks, called characteristic peaks, are primarily used in the identification of a material and Bragg’s Law]its crystal structure.
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