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== Characterization of CdSe ==
While there are many techniques to perform a quantitative analysis, here we will focus on two of the more common tools for material analysis: [http://en.wikipedia.org/wiki/X-ray_Diffraction X-Ray Diffraction ] (XRD) and [http://en.wikipedia.org/wiki/Ultraviolet%E2%80%93visible_spectroscopy Ultraviolet-visible spectroscopy ] (UV-Vis) analyses.
X-Ray Diffraction Analysis-XRD is a common tool used to analyze and characterize different materials and their properties. The procedure sees a small powder or thin film sample loaded into an X-Ray diffractometer and then exposed to X-Rays. The angle at which the incident rays meet the sample and the angle at which the diffracted rays are caught by the detector are changed periodically during the test. [Image of Diffractometer should be here]. This is because different materials will have different positions where the energy diffracted toward the detector is at its highest, these will form the peaks we see on diffractograms. [Need to insert short discussion on what can be learned from diffractograms and Bragg’s Law]
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